Found it... I would like to work the "Chromatogram Extraction Width" values back to resolution. What would be formula if "TOF" is set as mass analyzer in the full scan settings for precursor and products?
Is there a way to plot these values in Skyline or will have to do externally via an exported report?
It is not on our priority list to explore extraction width as a dynamic property. It is a fundamental property of how Skyline (and OpenSWATH) work that they do not perform any peak finding in the m/z dimension. They simply target an m/z and extract the signal found within a range of that target, modeled after how quadrupole function in SRM. You can consider the extraction width an insilico quadrupole. In fact, we originally saw this as a major benefit with TOF data where profile peaks are less uniform and Gaussian than Thermo Orbitrap data.
If you can prove that you have an algorithm for dynamically determining extraction width that improves performance, and you can get that published, we would certainly consider implementing it in Skyline, but it is not an area of research for us.
Thanks for your observations, though.